A high-contrast inpainting scheme based on the Complex Ginzburg-Landau equation recently applied successfully to image restoration is applied to SAR interferograms to improve their quality and therefore final quality of Digital Elevation Models (DEMs). The new technique attempts to recover the phase values in low coherence regions through diffusion and inpainting. After phase unwrapping low coherence regions are masked and discarded and a Complex Ginzburg-Landau (CGL) inpainting scheme is applied to regions where phase values are missing. We demonstrate that the residues reduce and the proposed algorithm leads to a higher Signal-to-Noise Ratio (SNR) if compared with MCF algorithm. The restoration technique has been applied to ERS-1 and ERS-2 data sets acquired on July 1995. Results appear to be very promising: the proposed algorithm provides good performances especially in presence of strong noise level and low coherence areas with relatively small dimensions. © 2010 IEEE.

Phase retrieval in SAR interferograms using diffusion and inpainting

Pallotta L.;
2010-01-01

Abstract

A high-contrast inpainting scheme based on the Complex Ginzburg-Landau equation recently applied successfully to image restoration is applied to SAR interferograms to improve their quality and therefore final quality of Digital Elevation Models (DEMs). The new technique attempts to recover the phase values in low coherence regions through diffusion and inpainting. After phase unwrapping low coherence regions are masked and discarded and a Complex Ginzburg-Landau (CGL) inpainting scheme is applied to regions where phase values are missing. We demonstrate that the residues reduce and the proposed algorithm leads to a higher Signal-to-Noise Ratio (SNR) if compared with MCF algorithm. The restoration technique has been applied to ERS-1 and ERS-2 data sets acquired on July 1995. Results appear to be very promising: the proposed algorithm provides good performances especially in presence of strong noise level and low coherence areas with relatively small dimensions. © 2010 IEEE.
2010
978-1-4244-9565-8
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11563/160509
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