The phase diagram of the Yb–Si system has been studied up to about 80 at.% Si by means of multitechnique investigations: differential thermal analysis (DTA), X-ray diffraction (XRD), optical microscopy (LOM), electron probe microanalysis (EMPA) and complemented with tensimetric measurements using the Knudsen effusion–mass spectrometry (KE–MS) and Knudsen effusion–weight loss (KE–WL) techniques. Besides the four already known intermediate phases: Yb Si (Mn Si -type), YbSi (CrB-type), Yb Si (Th Pd -type) and 5 3 5 3 3 5 3 5 YbSi (AlB -type), two new compounds have been found and completely characterized: Yb Si (Sm Ge -type) and Yb Si (Ho Si -type). Two eutectics occur in this system: at less than 1 at.% Si (815 8C) and at about 82 at.% Si (1145 8C).

The phase diagram of the Yb-Si system

BRUTTI, SERGIO;
2003-01-01

Abstract

The phase diagram of the Yb–Si system has been studied up to about 80 at.% Si by means of multitechnique investigations: differential thermal analysis (DTA), X-ray diffraction (XRD), optical microscopy (LOM), electron probe microanalysis (EMPA) and complemented with tensimetric measurements using the Knudsen effusion–mass spectrometry (KE–MS) and Knudsen effusion–weight loss (KE–WL) techniques. Besides the four already known intermediate phases: Yb Si (Mn Si -type), YbSi (CrB-type), Yb Si (Th Pd -type) and 5 3 5 3 3 5 3 5 YbSi (AlB -type), two new compounds have been found and completely characterized: Yb Si (Sm Ge -type) and Yb Si (Ho Si -type). Two eutectics occur in this system: at less than 1 at.% Si (815 8C) and at about 82 at.% Si (1145 8C).
2003
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11563/27053
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